Ag. Salinger et al., Analysis of gallium arsenide deposition in a horizontal chemical vapor deposition reactor using massively parallel computations, J CRYST GR, 203(4), 1999, pp. 516-533
A numerical analysis of the deposition of gallium arsenide from trimethylga
llium (TMG) and arsine in a horizontal CVD reactor with tilted susceptor an
d a 3 " diameter rotating substrate is performed. The three-dimensional mod
el includes complete coupling between fluid mechanics, heat transfer, and s
pecies transport, and is solved using an unstructured finite element discre
tization on a massively parallel computer. A reaction mechanism consisting
of three surface and two bulk species, four surface reactions, and four gas
phase species was used to model the deposition. The effects of three opera
ting parameters (the disk rotation rate, inlet TMG fraction, and inlet velo
city) and two design parameters (the tilt angle of the reactor base and the
reactor width) on the growth rate and uniformity are presented. The nonlin
ear dependence of the growth rate uniformity on the key operating parameter
s is discussed in detail. Efficient and robust algorithms for massively par
allel reacting flow simulations, as incorporated into our analysis code MFS
alsa, make detailed analysis of this complicated system feasible. (C) 1999
Elsevier Science B.V. All rights reserved.