Defect-induced microstructures: an X-ray diffraction analysis

Authors
Chrosch, J Colombo, M Memmi, I Biagini, R
Citation
J. Chrosch et al., Defect-induced microstructures: an X-ray diffraction analysis, J MATER SCI, 34(10), 1999, pp. 2263-2267
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
34
Issue
10
Year of publication
1999
Pages
2263 - 2267
Database
ISI
SICI code
0022-2461(19990515)34:10<2263:DMAXDA>2.0.ZU;2-R
Abstract
Single crystal X-ray diffraction was applied in order to investigate defect -induced microstructures in radiation damaged zircon. The formation of doma ins with different degrees of order was observed and in particular, it was possible to distinguish two types of defects: isolated lattice defects and dislocations. These lattice deformations have a great influence on the stru ctural and physical properties of the materials. (C) 1999 Kluwer Academic P ublishers.