The liquid-phase chemical-enhanced oxidation technique has been demonstrate
d to be an effective means of growing stable native films on GaAs. The gall
ium-ion-containing solution results in a fairly high oxidation rate near ro
om temperature. The pH value of the oxidation solution appears to be a domi
nant factor in the kinetics of oxidation. Due to the enhancement of Ga-cont
aining cations in the solution, a window of initial pH values from approxim
ately 4.0 to 4.5 is found to be the optimum pH range for oxide growth. The
pH-incorporated mechanism provides consistent interpretations for the unusu
al experimental results such as etchback of oxide thickness and increase of
refractive index. In addition, the results of the pH-controlled procedure
confirms the proposed role of pH. According to secondary ion mass spectrosc
opy profiles, it is found that the increasing As/Ga ratio of the oxide film
contributes to the increase of oxide refractive index. (C) 1999 The Electr
ochemical Society. S0013-4651(98)09-050-8. All rights reserved.