Study of factors limiting electron mobility in InSb quantum wells

Citation
Sj. Chung et al., Study of factors limiting electron mobility in InSb quantum wells, J VAC SCI B, 17(3), 1999, pp. 1151-1154
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
3
Year of publication
1999
Pages
1151 - 1154
Database
ISI
SICI code
1071-1023(199905/06)17:3<1151:SOFLEM>2.0.ZU;2-H
Abstract
We observe a significant increase in InSb quantum-well mobility when remote doping of Al0.09In0.91Sb barriers is accomplished by three layers, rather than one layer, of Si delta doping. At 7 K, the electron mobility in single quantum-well structures grown on GaAs substrates is as high as 280 000 cm( 2)/V s with an electron density of 2.33 x 10(11) cm(-2). The density of ori ented abrupt steps and square-mound features on the sample surface correlat es with the electron mobility in the well. (C) 1999 American Vacuum Society . [S0734-211X(99)04203-1].