Nucleation and growth of diamond film on porous silicon are investigated in
a hot-filament chemical vapor deposition system. The characters of diamond
film are determined by scanning electronic microscopy, Raman spectra and X
-ray photoelectron spectroscopy, A nucleation density of 3.6 x 10(7) cm(-2)
is obtained. We find that almost air nuclei occur at the edge of the etche
d pores. The diamond film directly deposits on porous silicon substrate wit
hout the intermediate and no strains are found in the film.