Br. Bass et al., Fracture assessment of shallow-flaw cruciform beams tested under uniaxial and biaxial loading conditions, NUCL ENG DE, 188(3), 1999, pp. 259-288
A technology to determine shallow-flaw fracture toughness of reactor pressu
re vessel (RPV) steels is being developed for application to the safety ass
essment of RPVs containing postulated shallow surface flaws. Matrices of cr
uciform beam tests were developed to investigate and quantify the effects o
f temperature, biaxial loading, and specimen size on fracture initiation to
ughness of two-dimensional (constant depth), shallow, surface flaws. The cr
uciform beam specimens were developed at Oak Ridge National Laboratory (ORN
L) to introduce a far-field, out-of-plane biaxial stress component in the t
est section that approximates the nonlinear stresses resulting from pressur
ized-thermal-shock or pressure-temperature loading of an RPV. Tests were co
nducted under biaxial load ratios ranging from uniaxial to equibiaxial. The
se tests demonstrated that biaxial loading can have a pronounced effect on
shallow-flaw fracture toughness in the lower transition temperature region
for an RPV material. The cruciform fracture toughness data were used to eva
luate fracture methodologies for predicting the observed effects of biaxial
loading on shallow-flaw fracture toughness. Initial emphasis was placed on
assessment of stress-based methodologies, namely, the J-Q formulation, the
Dodds-Anderson toughness scaling model, and the Weibull approach. Applicat
ions of these methodologies based on the hydrostatic stress fracture criter
ion indicated an effect of loading-biaxiality on fracture toughness; the co
nventional maximum principal stress criterion indicated no effect. A three-
parameter Weibull model based on the hydrostatic stress criterion is shown
to correlate with the experimentally observed biaxial effect on cleavage fr
acture toughness by providing a scaling mechanism between uniaxial and biax
ial loading states. (C) 1999 Elsevier Science S.A. All rights reserved.