Bi2Sr2CuO6+delta/ACuO(2) (A = Ca,Sr) superconducting multilayers obtained by molecular beam epitaxy

Bi-based superconducting multilayers, consisting of Bi2Sr2CuO6+delta (2201) layers alternately stacked with CaCuO2 or SrCuO2 layers, have been deposit ed by Molecular Beam Epitaxy (MBE) using co-deposition and growth interrupt ion techniques. In situ Reflection High Energy Electron Diffraction (RHEED) has been used to monitor the surface of the different layers giving eviden ce of a two-dimensional growth mode. The layered structure of the samples h as been confirmed by X-ray diffraction analyses. Resistive measurements hav e shown superconducting 2201/CaCuO2 samples with critical temperatures stro ngly depending on the thickness of the CaCuO2. The 2201/SrCuO2 multilayers do not show a zero electrical resistance above 4.2 K, but the resistance vs . temperature curves present a sharp decrease around 60 K indicative of a s uperconducting onset. (C) 1999 Elsevier Science B.V. All rights reserved.