X-ray nonspecular scattering method is used to study the structures of
Mo thin films fabricated with magnetron sputtering under different Ar
pressures, The results show that with the increase of Ar pressure, th
e density of amorphous Mo film decreased; the surface roughness of the
films increased, while the surface coherent length decreased. The abn
ormal glow discharging in the sputtering processes interprets the obse
rved results well.