Raman spectroscopy for characterizing compositional intermixing in GaAs AlGaAs heterostructures

Citation
As. Helmy et al., Raman spectroscopy for characterizing compositional intermixing in GaAs AlGaAs heterostructures, APPL PHYS L, 74(26), 1999, pp. 3978-3980
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
26
Year of publication
1999
Pages
3978 - 3980
Database
ISI
SICI code
0003-6951(19990628)74:26<3978:RSFCCI>2.0.ZU;2-R
Abstract
Compositional intermixing induced by the process of impurity-free vacancy ( dielectric cap annealing induced) disordering in GaAs/AlGaAs is studied usi ng Raman spectroscopy. The degree of intermixing in multiple-quantum-well s tructures was detected through the energy shift of certain Raman modes of t he lattices. In addition, localized intermixing, with band-gap shifts as lo w as 6 nm realized in 1:1 band-gap grating patterns with different periods (greater than or equal to 4 mu m), was also detected through the energy shi ft and the full width at half maximum of the structures's Raman modes. (C) 1999 American Institute of Physics. [S0003-6951(99)01226-7].