M. Brazier et al., Ferroelectric fatigue of Pb(Zr,Ti)O-3 thin films measured in atmospheres of varying oxygen concentration, APPL PHYS L, 74(26), 1999, pp. 4032-4033
Ferroelectric fatigue in Pb(Zr,Ti)O-3 films was found to be remarkably sens
itive to the oxygen partial pressure of the atmosphere above the film durin
g measurement. Films with Zr/Ti ratios of 55/45 and 75/25 were subjected to
ferroelectric fatigue testing at room temperature in atmospheres of variou
s oxygen partial pressure, or pO(2). The number of switching cycles at whic
h the onset of fatigue occurred was found to be sharply peaked with respect
to the oxygen partial pressure surrounding the sample. Such a striking dep
endence on the oxygen concentration strongly supports current theories for
fatigue that involve oxygen vacancy migration. (C) 1999 American Institute
of Physics. [S0003-6951(99)00726-3].