S. Hontsu et al., Metal/ferroelectric/superconductor field effect transistor using Pb(Zr0.52Ti0.48)O-3/(Y0.6Pr0.4)Ba2Cu3O7-y heterostructures, APPL SUPERC, 6(7-9), 1998, pp. 367-372
Metal (Al,Ag,Au)/ferroelectric (Pb(Zr0.52Ti0.48)O-3 [PZT])/high-T-c superco
nductor ((Y1-x Pr-x)Ba2CU3O7-y [YPBCO]) structures have been fabricated by
ArF excimer laser deposition. Ferroelectric properties of c-axis oriented e
pitaxial PZT films on YBa2Cu3O7-y [YBCO]//SrTiO(3)3(100) have been studied
as a function of temperature in the range of 20-290 K. Samples with three k
inds of metal electrode show almost similar ferroelectric properties at 290
K. The remanent polarization and coercive field are about 25 mu C/cm(2) an
d 146 kV/cm, respectively. At low temperature, on the contrary,the ferroele
ctric properties of heterostructures were strongly influenced by the choice
of the electrode metal. It seems that these properties are severely affect
ed by interface slates of metal PZT. The Au electrode gives rise to the bes
t ferroelectric property of PZT films. We also investigated the ferroelectr
ic field effect in the heterostructures of Au/ PZT/(Y0.6Pr0.4)Ba2Cu3O7-y. A
large modulation (as much as similar to 40%) and memory effects are observ
ed in the low frequency source-drain current response to a pulsed voltage.
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