P. Maravelaki-kalaitzaki et al., Excimer laser cleaning of encrustation on Pentelic marble: procedure and evaluation of the effects, APPL SURF S, 148(1-2), 1999, pp. 92-104
This work focuses on the use and control of excimer lasers (KrF, lambda = 2
48 nm and XeCl, lambda = 308 nm) for the removal of encrustation (black cru
sts, soil-dust and biological deposits) from Pentelic marble. A number of s
urface analytical techniques, such as Fourier transform infrared spectrosco
py (FTIR), scanning electron microscopy (SEM) interfaced with microprobe an
alysis (energy dispersive X-ray analysis: EDX), X-ray diffraction (XRD), la
ser-induced breakdown spectroscopy (LIBS) and optical microscopy (OM) were
used to detect chemical composition and crust morphology, as well as to mon
itor the effects induced by the laser treatment. SEM and OM providing struc
tural information about the layers of encrustation, LIES and SEM-EDX provid
ing information on the elemental composition of the ablated material, XRD a
nd FTIR detecting the changes of minerals appear to be particularly effecti
ve in assessing the quality of cleaning process, FTIR and XRD showed remova
l of pollutants from encrustation and partial transformation of calcium sul
fate dihydrate (gypsum) to hemihydrate and anhydrite, which have lower spec
ific surface than gypsum. Irradiation conditions creating minimal damaging
effects were defined before treatment through surface analysis, ablation ra
te studies and optimization of laser parameters. On the basis of structural
and analytical examinations, both lasers are shown to be appropriate for a
chieving sufficient removal of unwanted selected layers without modifying t
he surface morphology and surpassing by far the effectiveness afforded by t
raditional cleaning techniques. (C) 1999 Elsevier Science B.V. All rights r
eserved.