Characterization of nitrogen terminated silicon nanoparticles on AFI zeolite with X-ray and ultraviolet photoelectron spectroscopies

Citation
Ck. Choo et al., Characterization of nitrogen terminated silicon nanoparticles on AFI zeolite with X-ray and ultraviolet photoelectron spectroscopies, APPL SURF S, 148(1-2), 1999, pp. 116-125
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
148
Issue
1-2
Year of publication
1999
Pages
116 - 125
Database
ISI
SICI code
0169-4332(199906)148:1-2<116:CONTSN>2.0.ZU;2-B
Abstract
Nitrogen terminated silicon nanoparticles were synthesized on AFI AlPO4-5 z eolite by pulsed Laser ablation of silicon target in the presence of 1.33 x 10(-5) Pa of ammonia, and were characterized in situ by X-ray photoemissio n spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). Nons toichiometric silicon nitride and unterminated silicon nanoparticles with s ize of estimated to be similar to 5.4 Angstrom in diameter were existed. Th ey were found to migrate and diffuse into the AlPO4-5 channels at 373 K and migrate back to the external surface at 503 K. The effect of sample anneal ing was studied at 373 K. Thr change of silicon surface state (unterminated silicon nanoparticles) to hydride species was observed concurrently with b reaking of the NHx species. This result implies that the NHx species remain ed on the silicon particles form Si3N4 like bonds and the dissociated H-spe cies are bound to the unterminated silicon surface. (C) 1999 Elsevier Scien ce B.V. All rights reserved.