A relationship is described between the intermodulation distortion (IMD) pe
rformance of a parallel MESFET switch to the device's experimentally extrac
ted higher order derivatives. As the third-order I-ds(V-gs, V-ds) Taylor-se
ries coefficients support a nonoptimum linearity in cold FET operation (V-D
S = 0V), a small drain-to-source voltage 'sweet spot' has been found for IM
D reduction, giving a useful bias point for highly linear switching applica
tions without degrading attenuation.