High-voltage sustaining structure with embedded oppositely doped regions

Citation
Xb. Chen et al., High-voltage sustaining structure with embedded oppositely doped regions, IEE P-CIRC, 146(2), 1999, pp. 90-94
Citations number
9
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS
ISSN journal
13502409 → ACNP
Volume
146
Issue
2
Year of publication
1999
Pages
90 - 94
Database
ISI
SICI code
1350-2409(199904)146:2<90:HSSWEO>2.0.ZU;2-Q
Abstract
A voltage-sustaining structure with embedded oppositely doped islands is pr oposed. Due to the compensation of the field induced by these regions, the doping density of the voltage-sustaining layer can be made larger than that in a conventional voltage-sustaining layer with the same breakdown voltage , and therefore the on-voltage can be reduced. The theory of design for suc h structures is found to be in good agreement with the results of full 2-di mensional simulation. The on-state performance, the transient behaviour and the potential applications of this structure in power devices are also dis cussed.