Parametric wafer map visualization

Authors
Lin, YA
Citation
Ya. Lin, Parametric wafer map visualization, IEEE COMP G, 19(4), 1999, pp. 14-17
Citations number
7
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE COMPUTER GRAPHICS AND APPLICATIONS
ISSN journal
02721716 → ACNP
Volume
19
Issue
4
Year of publication
1999
Pages
14 - 17
Database
ISI
SICI code
0272-1716(199907/08)19:4<14:PWMV>2.0.ZU;2-K