Analysis of sharp metal edges at 45 degrees to the FDTD grid

Citation
Kp. Esselle et al., Analysis of sharp metal edges at 45 degrees to the FDTD grid, IEEE MICR G, 9(6), 1999, pp. 221-223
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE MICROWAVE AND GUIDED WAVE LETTERS
ISSN journal
10518207 → ACNP
Volume
9
Issue
6
Year of publication
1999
Pages
221 - 223
Database
ISI
SICI code
1051-8207(199906)9:6<221:AOSMEA>2.0.ZU;2-B
Abstract
New finite-difference time-domain (FDTD) update equations for sharp metal e dges are presented. The edge is assumed to be diagonal to the Yee cell face s. Derived using the contour-path method, the new equations properly model the singular field near the edge even with a relatively coarse grid. A dram atic improvement in computed accuracy was observed when a stripline with tw o sharp edges was analyzed using the new equations instead of standard FDTD techniques; The new equations are found to be stable even with the maximum allowed time step, easy to implement, and do not increase computer memory and time requirements.