A novel on-wafer resistive noise source

We describe a novel on-wafer resistive noise source (ORNS) suitable for noi se parameter characterization of microwave devices using the cold noise pow er measurement technique. The noise source can enhance measurement accuracy by providing a calibrated noise temperature directly at the device referen ce plane. A procedure to determine the excess noise ratio of the noise sour ce is presented. Noise figure measurements performed up to 40 GHz with the on-wafer noise source and with a commercial coaxial noise source are in goo d agreement, thereby validating the technique, The novel source is effectiv e as a noise standard up to millimeter-wave frequencies.