A fast nonenumerative automatic test pattern generator for path delay faults

This paper presents a nonenumerative automatic test pattern generator for r obustly testable path delay faults. In contrast to earlier work [26], the p attern generator takes into consideration the conditions for robust propaga tion while sensitizing sets of paths. This increases the probability of tes ting them robustly with a single test. Novel algorithms are described which identify sets that contain many such potentially compatible paths. The num ber of detected faults is estimated using a simple and fast method. The app roach compares favorably to [26] in both fault detection and time performan ce.