Global time-domain full-wave analysis of microwave circuits involving highly nonlinear phenomena and EMC effects

The global time-domain analysis of microwave circuits involving highly nonl inear phenomena such as injection locking and intermodulation, along with p arasitic effects and electromagnetic compatibility (EMC) issues is presente d in this paper. Employing the concept of equivalent sources, the device-wa ve interaction is characterized and incorporated into the finite-difference time-domain method. The investigation of nonlinear phenomena is accomplish ed by utilizing a large-signal device circuit model. Measured results are a lso provided for comparisons with simulated results. The applicability of t his equivalent-source algorithm for investigating EMC effects is also demon strated, A correspondence between simulated and measured EMC phenomenon ind icates the usefulness of this algorithm in providing an effective tool for real world radio-frequency front-end circuit designs.