Use of polytetrafluoroethylene slurry for silica matrix removal in ETAAS direct determination of trace cobalt and nickel in silicon dioxide powder

Citation
Fy. Wang et al., Use of polytetrafluoroethylene slurry for silica matrix removal in ETAAS direct determination of trace cobalt and nickel in silicon dioxide powder, J ANAL ATOM, 14(6), 1999, pp. 963-966
Citations number
26
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
ISSN journal
02679477 → ACNP
Volume
14
Issue
6
Year of publication
1999
Pages
963 - 966
Database
ISI
SICI code
0267-9477(199906)14:6<963:UOPSFS>2.0.ZU;2-J
Abstract
A novel method for the direct determination of trace Co and Ni in SiO2 powd er by slurry sampling ETAAS was developed. At high temperature of the graph ite furnace, a PTFE slurry in HNO3 was used as a fluorinating reagent to co nvert the silica matrix into high-volatility fluoride, which was subsequent ly evaporated by selective vaporization prior to the atomization of analyte s. In this case, the severe interference of the matrix on the vaporization and atomization of analytes was reduced significantly, and chemical attack of the excess of silica matrix on the graphite tube was also minimized. The proposed method was successfully applied to the determination of trace Co and Ni in SiO2 powder with aqueous calibration and minimum chemical pre-tre atment. For the direct analysis of high purity SiO2 powder, the detect limi ts of Co and Ni were 18.8 and 35.0 ng g(-1), respectively. The analysis of NIES CRM2 Pond Sediment confirmed the reliability of the approach.