Interrelations between defects in the Hg1-xCdxTe epilayers and their measured lattice parameters and composition

Absolute values of lattice parameters in Hg1-xCdxTe epilayers were precisel y measured by high-resolution x-ray diffraction (Bond method), and then com pared with those calculated using Cd contents, x, which were derived from F ourier transform infrared transmission spectra. A part of the samples revea led significant discrepancies between measured and calculated lattice param eters, the differences being both of positive and negative signs. The obtai ned results are discussed in the framework of clusters of the point defects that were visualized by high-resolution scanning electron microscopy.