A. Vial et al., Spectroscopic study of the image formation in near-field microscopy, near an evanescent-homogeneous switching, J MICROSC O, 194, 1999, pp. 265-270
Near-field optical microscopes provide highly resolved images of various sa
mples. However, images are difficult to interpret owing to their sensitivit
y to illumination conditions. Moreover, by contrast with classical microsco
py, the near-field signal combines the contributions of evanescent and prop
agative modes. In this study, we present results of a spectroscopic study i
n near-field. Our purpose is to explain how a switching of one diffracted m
ode from homogeneous to evanescent can modify image formation. The main poi
nt is to establish a relation between the evanescence of one diffracted mod
e and the fringes that are often observed in near-field experimental images
. Moreover, on a metallic sample, the possible occurrence of plasmon resona
nce contributes to image distortion in a mainly different way. We use a Fou
rier series Rayleigh 3D method to explain image formation.