Polarization properties of the near-field intensity reflected by metallic and dielectric one-dimensional structures

Citation
S. Wang et Er. Mendez, Polarization properties of the near-field intensity reflected by metallic and dielectric one-dimensional structures, J MICROSC O, 194, 1999, pp. 271-280
Citations number
22
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF MICROSCOPY-OXFORD
ISSN journal
00222720 → ACNP
Volume
194
Year of publication
1999
Part
2-3
Pages
271 - 280
Database
ISI
SICI code
0022-2720(199905/06)194:<271:PPOTNI>2.0.ZU;2-X
Abstract
We investigate the state of polarization and near-field intensity distribut ion in the vicinity of rectangular groove objects ruled on metallic and die lectric materials. The sample is illuminated from the vacuum side by a line ar combination of p- and s-polarised waves. Two rigorous methods of solutio n are used and compared in calculations of the total intensity at constant height when the light is incident normally onto the surface, Some calculati ons of the total intensity in the 'follow-the-profile mode' are also presen ted. It is shown that in the constant height mode, the contrast in the imag e can be reversed as the plane of observation moves away from the mean plan e of the sample. We also found that the state of polarization depends stron gly on the material and the distance to the plane of detection.