Towards better scanning near-field optical microscopy probes - progress and new developments

Several approaches are described with the aim of producing near-field optic al probes with improved properties. Focused ion beam milling allows the fab rication of small apertures in a controlled fashion, resulting in probes wi th excellent polarization properties and increased transmission. Microfabri cation processes are described that allow the production of apertures of 30 -50 nm, facilitating the mass-fabrication of apertured tip structures that can be used in a combined force/near-field optical microscope. Finally, pos sible future developments are outlined.