Spectrally resolved cathodoluminescence analyses in the optical near-field

Citation
Rm. Cramer et al., Spectrally resolved cathodoluminescence analyses in the optical near-field, J MICROSC O, 194, 1999, pp. 412-414
Citations number
9
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF MICROSCOPY-OXFORD
ISSN journal
00222720 → ACNP
Volume
194
Year of publication
1999
Part
2-3
Pages
412 - 414
Database
ISI
SICI code
0022-2720(199905/06)194:<412:SRCAIT>2.0.ZU;2-6
Abstract
By implementing a scanning near-field optical microscope into the specimen chamber of a scanning electron microscope, cathodoluminescence can be local ly detected in the optical near-field. The achievable spatial resolution in this set-up is only limited by the size of the aperture in a coated fibre probe and its separation from the sample, rather than by the energy dissipa tion volume of the primary electrons and diffusion processes of excess carr iers inside the specimen, We demonstrate how electronically active defects in polycrystalline diamond can be distinguished and localized with sub-wave length lateral resolution by spectral filtering of the cathodoluminescence signal.