XPS and IR characterization of manganese ions deposited on alumina

Authors
Kantcheva, M Kucukkal, MU Suzer, S
Citation
M. Kantcheva et al., XPS and IR characterization of manganese ions deposited on alumina, J MOL STRUC, 483, 1999, pp. 19-22
Citations number
11
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF MOLECULAR STRUCTURE
ISSN journal
00222860 → ACNP
Volume
483
Year of publication
1999
Pages
19 - 22
Database
ISI
SICI code
0022-2860(19990525)483:<19:XAICOM>2.0.ZU;2-7
Abstract
By application of XPS and FTIR spectroscopy of adsorbed CO the effect of pr eparation conditions on the state and localization of manganese ions deposi ted on eta-Al2O3 is studied. Both Mn2+ and Mn3+ ions are observed on the im pregnated sample. The sample obtained by ion exchange contains only Mn3+ io ns. The adsorbed CO species are identified. (C) 1999 Elsevier Science B.V. All rights reserved.