Microscale deformations are investigated in numerical DEM experiments of a
large two dimensional assembly of disks. The assembly was subjected to quas
i-static biaxial loading at small to moderate strains. Deformations within
individual voids were computed from the relative motions of surrounding par
ticles. Evolution of the local fabric was measured in terms of void-based p
arameters, including effective void ratio, void cell valence, and shape-elo
ngation of the voids, all of which increased monotonically during loading.
A direct correlation was measured between local void shape and dilation, wh
ich accounts for the transition from compressive to dilatant behavior. Defo
rmation was very nonuniform at the microscale of individual voids. The pred
ominant deformation structures were thin obliquely trending bands of void c
ells within which slip deformation was most intense. These "microbands" app
eared spontaneously throughout the test, even at the start of loading. The
microbands ranged in thickness between one and four particle diameters. Unl
ike shear bands, the microbands were neither static nor persistent: they wo
uld emerge, move, and disappear. Their orientation angle increased as defor
mation proceeded. Dilation was slightly larger within the microbands than i
n the surrounding material. Void shapes within the microbands were somewhat
elongated, with an elongation direction that was related to the orientatio
ns of the microbands. Energy dissipation was concentrated within the microb
ands, even at small strains. In a small cycle of loading and unloading, loc
al fluctuations in the elastic and plastic slips occurred in opposite direc
tions. No spatial relation was found between the deformation microbands and
chains of the most heavily loaded particles. Particle rotations were struc
tured, with the most rapid rotations occurring within and near microbands.
The rotations tended to relieve sliding between most particles, but transfe
rred the sliding to a few contacts at which frictional slipping was most in
tense. (C) 1999 Elsevier Science Ltd. All rights reserved.