Metal wire definition by high resolution imprint and lift-off

Citation
D. Eisert et al., Metal wire definition by high resolution imprint and lift-off, MICROEL ENG, 46(1-4), 1999, pp. 179-181
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
46
Issue
1-4
Year of publication
1999
Pages
179 - 181
Database
ISI
SICI code
0167-9317(199905)46:1-4<179:MWDBHR>2.0.ZU;2-A
Abstract
Metal wires down to 25 nm width were fabricated using a simple imprint tech nology yet showing high resolution. The patterns were transferred with high geometric control from the silicon mold into a 100 nm thick PMMA layer by pressing the mold into die resist at a temperature of 140 degrees C for 20 min. Then the PMMA layer was thinned by Argon plasma etching and 10 nm thic k Gold wires were defined by evaporation and lift-off. Similarly, by imprin t in a three layer resist structure with an intermediate metal layer used a s an etch stop 25 nm wide wires could be defined with larger process latitu de.