This paper reports on the fabrication process of phase mask for fiber grati
ng printing. The masks are produced by Electron Beam Lithography (EBL) and
Reactive Ion Etching (RIE). A special writing strategy is used in order to
reduce the stitching errors. RIE with CHF3 will be discussed. Finally morph
ological and optical characterization of the phase mask and of the photo in
duced fiber grating will be discussed.