Stencil masks for high energy ion projection

Citation
U. Weidenmuller et al., Stencil masks for high energy ion projection, MICROEL ENG, 46(1-4), 1999, pp. 489-492
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONIC ENGINEERING
ISSN journal
01679317 → ACNP
Volume
46
Issue
1-4
Year of publication
1999
Pages
489 - 492
Database
ISI
SICI code
0167-9317(199905)46:1-4<489:SMFHEI>2.0.ZU;2-1
Abstract
A high energy ion projector under construction will allow mask controlled i on beam implantation at demagnification between 10x and 100x. For energetic ions the material of the mask must be chosen in view of the required value s of the stopping power and heat conduction. Thermal expansion and sputter effects are to be minimised. In a first experiment a 16x reduced projection of a copper mask with 20 mu m wide structures was realized. To improve the resolution to 250 nm on the target mask structures of 4 mu m are required.