This paper proposes a kind of computer-aided contact-type interferometer fo
r testing the microdisplacement of piezoelectric ceramics (PZT). Its accura
cy is better than 0.01 mu m. A data acquisition system, including a CCD, gr
abber, etc., has been used to detect and digitize interferograms. This syst
em analyzes a two-dimensional interferogram automatically and quickly, whil
e both calibrate with monochromatic fringes and test with achromatic fringe
s. Software has been used to analyze the two-dimensional interferogram and
to rest the nonlinearity and hysteresis of PZT. (C) 1999 John Wiley & Sons,
Inc.