Computer-aided interferometer for testing microdisplacement of piezoelectric ceramics

Citation
Y. Zhu et al., Computer-aided interferometer for testing microdisplacement of piezoelectric ceramics, MICROW OPT, 22(1), 1999, pp. 72-74
Citations number
5
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
22
Issue
1
Year of publication
1999
Pages
72 - 74
Database
ISI
SICI code
0895-2477(19990705)22:1<72:CIFTMO>2.0.ZU;2-W
Abstract
This paper proposes a kind of computer-aided contact-type interferometer fo r testing the microdisplacement of piezoelectric ceramics (PZT). Its accura cy is better than 0.01 mu m. A data acquisition system, including a CCD, gr abber, etc., has been used to detect and digitize interferograms. This syst em analyzes a two-dimensional interferogram automatically and quickly, whil e both calibrate with monochromatic fringes and test with achromatic fringe s. Software has been used to analyze the two-dimensional interferogram and to rest the nonlinearity and hysteresis of PZT. (C) 1999 John Wiley & Sons, Inc.