Time delay and integration imaging for internal profile inspection

Authors
Tay, CJ Toh, SL Shang, HM
Citation
Cj. Tay et al., Time delay and integration imaging for internal profile inspection, OPT LASER T, 30(8), 1998, pp. 459-465
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS AND LASER TECHNOLOGY
ISSN journal
00303992 → ACNP
Volume
30
Issue
8
Year of publication
1998
Pages
459 - 465
Database
ISI
SICI code
0030-3992(199811)30:8<459:TDAIIF>2.0.ZU;2-6
Abstract
A time delay and integration imaging technique is presented and applied to internal surface contour measurement. Using the proposed optical arrangemen t, inspection of profiles of objects which are mounted on the internal surf ace of a hollow cylinder can be carried out. Tests conducted on objects wit h diameters ranging from 40 to 214 mm show good agreement with results obta ined from conventional profilometer. (C) 1999 Elsevier Science Ltd. All rig hts reserved.