Refractive index measurement of the glass substrate of holographic plates using reflectivity data

Citation
C. Neipp et al., Refractive index measurement of the glass substrate of holographic plates using reflectivity data, OPTIK, 110(6), 1999, pp. 295-297
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTIK
ISSN journal
00304026 → ACNP
Volume
110
Issue
6
Year of publication
1999
Pages
295 - 297
Database
ISI
SICI code
0030-4026(1999)110:6<295:RIMOTG>2.0.ZU;2-N
Abstract
A simple method to measure the refractive index of plane parallel glass pla tes using reflectivity data is presented. The method is based on the analys is of Fresnel reflections which take place on the air-glass surfaces of the plate. One of these reflections is eliminated by using a black self-adhesi ve PVC masking tape on the back of the plate. The excellent agreement betwe en calculated and measured data confirms the applicability of the method.