Electrodynamic c-axis properties of YBa2Cu3O7-delta thin films in the THz frequency regime

Authors
Ludwig, C Sekinger, T Kuhl, J Habermeier, HU Tani, M Sakai, K Hangyo, M Miyazawa, S Mukaida, M
Citation
C. Ludwig et al., Electrodynamic c-axis properties of YBa2Cu3O7-delta thin films in the THz frequency regime, PHYS ST S-B, 213(2), 1999, pp. 405-413
Citations number
33
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI B-BASIC RESEARCH
ISSN journal
03701972 → ACNP
Volume
213
Issue
2
Year of publication
1999
Pages
405 - 413
Database
ISI
SICI code
0370-1972(199906)213:2<405:ECPOYT>2.0.ZU;2-V
Abstract
Using coherent THz pulse spectroscopy, we have analyzed the electrodynamic properties of thin YBa2Cu3O7-delta films in the temperature range between 1 0 and 300 K. The temperature dependence of the London penetration depth in c-axis direction determined from the complex conductivity yields clear evid ence for d-wave symmetry of the order parameter.