Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection

Citation
E. Higurashi et al., Nanometer-displacement detection of optically trapped metallic particles based on critical angle method for small force detection, REV SCI INS, 70(7), 1999, pp. 3068-3073
Citations number
25
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
7
Year of publication
1999
Pages
3068 - 3073
Database
ISI
SICI code
0034-6748(199907)70:7<3068:NDOOTM>2.0.ZU;2-V
Abstract
We have developed a method of measuring the displacement of optically trapp ed metallic particles (10 mu m in diameter) in water with nanometer resolut ion to detect small forces. Metallic particles were optically trapped in tw o dimensions by focusing a laser beam below the particle using an objective lens with a numerical aperture of 0.9. Displacement of a trapped metallic particle was detected using the light reflected from the particle based on the critical angle method. The lateral spring constant was estimated from t he equipartition theorem to be on the order of 10(-6) N/m and found to incr ease as the incident laser power increased. Consequently, a trapped metalli c particle can be used to detect small forces (10(-13) N). (C) 1999 America n Institute of Physics. [S0034-6748(99)01607-X].