Textures of CeO2 films grown on biaxially textured Pt0.7Pd0.3 substrates

We investigated the textures of CeO2 films grown on biaxially textured Pt0. 7Pd0.3 tapes, These might be of interest for developing new substrates of h igh Tc superconducting coated conductors for small scale applications. Usin g the rf sputtering method we deposited CeO2 films and characterized their textures by X-ray diffraction and scanning electron microscopy. We found th at the growth of the CeO2 film was highly influenced by the operating gas a s well as the inclination of the substrate during deposition. In the mixed gas of Ar + O-2, the CeO2 films grew with polycrystalline textures composed of (111)- and (002)-oriented domains. The CeO2 films deposited in an atmos phere of Ar, with inclination angles of less than 45 degrees, showed simila r polycrystallinity. However, the growth of the CeO2 films was always well textured in Ar gas with an inclination angle larger than 50 degrees. (C) 19 99 Elsevier Science S.A. All rights reserved.