Investigation of Sb-doped CdTe films using XPS, PIXE and XRD

Citation
Jp. Nair et al., Investigation of Sb-doped CdTe films using XPS, PIXE and XRD, THIN SOL FI, 347(1-2), 1999, pp. 39-45
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
347
Issue
1-2
Year of publication
1999
Pages
39 - 45
Database
ISI
SICI code
0040-6090(19990622)347:1-2<39:IOSCFU>2.0.ZU;2-A
Abstract
This paper describes an electrodeposition technique facilitating in situ do ping of CdTe with Sb in an electrodeposition bath containing CdCl2, TeCl4, KI and SbCl3 in ethylene glycol at 160 degrees C. The composition and struc ture of the undoped and doped films have been analysed using XPS, PIXE and XRD. It is shown that the Sb doped films contained relatively low percentag e of oxygen. Moreover, Sb doping promotes preferential orientation of low i ndex (111) plane of CdTe films. The direction of thermo-emf developed in p- type Sb-doped CdTe has also been shown to be opposite to the thermo-emf mea sured for undoped CdTe films. (C) 1999 Elsevier Science S.A. All rights res erved.