Chemical vapor deposition and structural study of La0.8MnO3-delta thin films

Citation
S. Pignard et al., Chemical vapor deposition and structural study of La0.8MnO3-delta thin films, THIN SOL FI, 347(1-2), 1999, pp. 161-166
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
347
Issue
1-2
Year of publication
1999
Pages
161 - 166
Database
ISI
SICI code
0040-6090(19990622)347:1-2<161:CVDASS>2.0.ZU;2-9
Abstract
We report here the synthesis of lacunar lanthanum manganites La0.8MnO3-delt a by a liquid source metal organic chemical vapor deposition technique whic h has been developed recently in our laboratory. The role of the substrate temperature on the growth rate, on the molar ratio La/Mn and on the crystal linity is studied for films deposited on MgO (001) single crystals. A struc tural study by means of X-ray diffraction (theta/2 theta scans, omega-scans , phi-scans) and scanning electron microscopy (channeling electron patterns ) has been achieved on lanthanum manganites films with the composition La-0 .8 MnO3-delta grown on three kinds of substrates: MgO (001), LaAlO3 (012) a nd SrTiO3 (001). Films on LaAlO3 and SrTiO3 show an epitaxial quality with a small mosaicity in the plane of the substrate. Due to a bigger lattice mi smatch with the substrate, films deposited on MgO present a worse crystalli ne quality with two types of epitaxially grown crystallites. (C) 1999 Elsev ier Science S.A. All rights reserved.