An X-ray absorption study of the local structure of cerium in electrochemically deposited thin films

Citation
M. Balasubramanian et al., An X-ray absorption study of the local structure of cerium in electrochemically deposited thin films, THIN SOL FI, 347(1-2), 1999, pp. 178-183
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
347
Issue
1-2
Year of publication
1999
Pages
178 - 183
Database
ISI
SICI code
0040-6090(19990622)347:1-2<178:AXASOT>2.0.ZU;2-J
Abstract
We have utilized the technique of X-ray absorption fine structure (XAFS) to study the oxidation state and structure of cerium in electrochemically dep osited thin films of cerium oxide (hydroxide). We find that anodic depositi on results in a hydrous cerium oxide phase in which the oxidation state of cerium is 4+. This material is highly structurally disordered but still has a medium range local structure (similar to 4 Angstrom) similar to CeO2. On the other hand, cathodic deposition leads to a Ce3+ phase, which is suscep tible to oxidation on exposure to air or by dissolved oxygen in solution. O ur results may be relevant to understanding the structure of cerium inhibit ors incorporated in corrosion films on aluminium and its alloys. (C) 1999 E lsevier Science S.A. All rights reserved.