Influence of non-perovskite phases on ferroelectric and dielectric behavior of electron-beam deposited PZT thin films

Crystalline structure-induced effects on the ferroelectric and dielectric p roperties in electron-beam deposited PZT thin films are described, TiO2 dis persion in PZT reduces dielectric constant and charge storage density to 40 0 and 5.4 mu C/cm(2) and increases dissipation factor. Pyrochlore PZT inclu sions cause further reduction to 60 and 77 nC/cm(2) but have no effect on m icroscopic polarization, Wide variation in relaxation times below 220 degre es C and Debye-like relaxation process above 220 degrees C is the character istics behavior of TiO2 mixed PZT films. A relaxation time constant of appr oximate to 10(-11) s with activation energy of 0.38 eV is observed in TiO2 mixed PZT. Inclusion of pyrochlore phase causes high time constant of relax ation process approximate to 4.2 mu s and large dissipation factor. (C) 199 9 Elsevier Science S.A. All rights reserved.