Molecular dynamics study of cluster deposition in thermal plasma flash evaporation

Citation
N. Yamaguchi et al., Molecular dynamics study of cluster deposition in thermal plasma flash evaporation, THIN SOL FI, 345(1), 1999, pp. 34-37
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
345
Issue
1
Year of publication
1999
Pages
34 - 37
Database
ISI
SICI code
0040-6090(19990507)345:1<34:MDSOCD>2.0.ZU;2-Q
Abstract
We simulated the rearrangement process of a high-temperature cluster put on a low-temperature substrate using molecular dynamics to verify the rearran gement behavior of the hot clusters. In the first step, a monoatomic homoge neous system wets simulated. A spherical fee stacked cluster consisting of 418 atoms corresponding to a 2 nm cluster, was placed on the 6 planes of a fee ( 1 1 1) substrate. The interaction potential was assumed to be the Mor se function corresponding to a material with a melting point of 1680 K. The substrate temperature T-sub and the initial cluster temperature T-cluster( init) were varied from 300 to 1000 K and from 1450 to 3000 K, respectively. In the case of T-cluster(init) < 2100 K, the degree of cluster rearrangeme nt is slight. Even at T-sub = 1000 K, the final structure was a six atomic- layer-high cap-like structure. On the other hand, clusters with T-cluster(i nit) > 2400 K rearranged markedly into almost two-dimensional clusters even at T-sub = 300 It and the degree of rearrangement seemed to be independent of the substrate temperature. It was revealed that high temperature nanosc ale clusters could deform easily even on a room-temperature substrate owing to their high internal energy. This was confirmed by scanning tunneling mi croscopy, (C) 1999 Published by Elsevier Science Ltd. All rights reserved.