N. Dumont et C. Depecker, Depth profiling analysis of polymer film using Diffuse Reflectance Infrared Fourier Transform Spectroscopy, VIB SPECTR, 20(1), 1999, pp. 5-14
A new sampling method is proposed to perform depth profiling analysis of mo
lecular species in polymer composites. This experimental technique is based
on a low cost sampling method using a SiC coated abrasive paper to extract
small amounts of polymer and analyse it by diffuse reflectance infrared sp
ectroscopy. We have investigated the main parameters which govern depth res
olution and spectral quality of the sampling method. Sampling pressure, abr
asion iterative number, abrasion length and SiC paper grit, have been studi
ed to evaluate their influence on the depth profiling analysis of a treated
polyethylene sample. (C) 1999 Elsevier Science B.V. All rights reserved.