Characteristics of ray traces at the back of biaxial crystals at normal incidence

Authors
Cojocaru, E
Citation
E. Cojocaru, Characteristics of ray traces at the back of biaxial crystals at normal incidence, APPL OPTICS, 38(19), 1999, pp. 4004-4010
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
38
Issue
19
Year of publication
1999
Pages
4004 - 4010
Database
ISI
SICI code
0003-6935(19990701)38:19<4004:CORTAT>2.0.ZU;2-D
Abstract
Ray vector traces that can be obtained at the back of a biaxial crystal thr ough crystal rotation are calculated numerically by variation of one of the three Euler angles. Negative and positive lossless biaxial crystals are co nsidered at normal incidence. Interesting features of these traces are evid enced by reference to the circular ring that forms at internal conical refr act;ion. (C) 1999 Optical Society of America.