Nanometer-level path-length control scheme for nulling interferometry

Authors
Citation
E. Serabyn, Nanometer-level path-length control scheme for nulling interferometry, APPL OPTICS, 38(19), 1999, pp. 4213-4216
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
38
Issue
19
Year of publication
1999
Pages
4213 - 4216
Database
ISI
SICI code
0003-6935(19990701)38:19<4213:NPCSFN>2.0.ZU;2-Q
Abstract
A method of stabilizing a dual-output rotational shearing inteferometer to the nanometer-level accuracy required for deep starlight nulling in planet searches is presented. In this approach one of the nulling beam combiner's two balanced outputs is used to control the other through a combination of external and internal path-length offsets. The path-length offsets sum to z ero for the nulling output and to lambda/4 for the control, or the quadratu re, output. In the quadrature output a 1-nm path-length error corresponds t o a 1% output-power variation, thus allowing subanometer control. (C) 1999 Optical Society of America.