An optimized rapid aluminum back surface field technique for silicon solarcells

Citation
S. Narasimha et al., An optimized rapid aluminum back surface field technique for silicon solarcells, IEEE DEVICE, 46(7), 1999, pp. 1363-1370
Citations number
23
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
46
Issue
7
Year of publication
1999
Pages
1363 - 1370
Database
ISI
SICI code
0018-9383(199907)46:7<1363:AORABS>2.0.ZU;2-S
Abstract
Screen-printing and rapid thermal annealing have been combined to achieve a n aluminum-alloyed back surface field (Al-BSF) that lowers the effective ba ck surface recombination velocity (S-eff) to approximately 200 cm/s for sol ar cells formed on 2.3 Ohm-cm Si. Analysis and characterization of the BSF structures show that this formation process satisfies the two main requirem ents for achieving ion S-eff: 1) deep p(+) regions and 2) uniform junctions , Screen-printing is ideally suited for fast deposition of thick Al films w hich, upon alloying, result in deep RSF regions. Use of a rapid alloying tr eatment is shown to significantly improve the BSF junction uniformity and r educe S-eff. The Al-BSF's formed by screen-printing and rapid alloying have been integrated into both laboratory and industrial-type fabrication seque nces to achieve solar cell efficiencies in excess of 19.0 and 17.0%, respec tively, on planar 2.3 Ohm-cm float zone Si. For both process sequences, the se cell efficiencies are 1-2% (absolute) higher than analogous cells made w ith unoptimized Al-BSF's or highly recombinative rear surfaces.