T. Ohguro et al., An 0.28-mu m CMOS for mixed digital and analog applications with zero-volt-v(th) epitaxial-channel MOSFET's, IEEE DEVICE, 46(7), 1999, pp. 1378-1383
An 0.18-mu m CMOS technology with multi-V-th's for mixed high-speed digital
and RF-analog applications has been developed. The V-th's of MOSFET's for
digital circuits are 0.4 V for NMOS and -0.4 V for PMOS, respectively. In a
ddition, there are n-MOSFET's with zero-volt-V-th for RF analog circuits, T
he zero-volt-V-th MOSFET's were made by using undoped epitaxial layer for t
he channel regions, Though the epitaxial film was grown by reduced pressure
chemical vapor deposition (RP-CVD) at 750 degrees C, the film quality is a
s good as the bulk silicon because high pre-heating temperature (940 degree
s C for 30 s) is used in H-2 atmosphere before the epitaxial growth. The ep
itaxial channel MOSFET shows higher peak g(m) and f(T) values than those of
bulk cases, Furthermore, the g(m) and f(T) values of the epitaxial channel
MOSFET show significantly improved performances under the lower supply vol
tage compared with those of bulk, This is very important for RF analog appl
ication for low supply voltage, The undoped-epitaxial-channel MOSFET's with
zero-V-th will become a key to realize high-performance and low-power CMOS
devices for mixed digital and RF-analog applications.