Accurate method for determining adhesion of cantilever beams

Citation
Mp. De Boer et Ta. Michalske, Accurate method for determining adhesion of cantilever beams, J APPL PHYS, 86(2), 1999, pp. 817-827
Citations number
42
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
2
Year of publication
1999
Pages
817 - 827
Database
ISI
SICI code
0021-8979(19990715)86:2<817:AMFDAO>2.0.ZU;2-4
Abstract
Using surface micromachined samples, we demonstrate the accurate measuremen t of cantilever beam adhesion by using test structures which are adhered ov er long attachment lengths. We show that this configuration has a deep ener gy well, such that a fracture equilibrium is easily reached. When compared to the commonly used method of determining the shortest attached beam, the present method is much less sensitive to variations in surface topography o r to details of capillary drying. (C) 1999 American Institute of Physics. [ S0021-8979(99)00414-4].