Application of the pressure wave propagation method for adhesion defects detection and quantification in bilayer structures

Citation
L. Ainouche et C. Alquie, Application of the pressure wave propagation method for adhesion defects detection and quantification in bilayer structures, J APPL PHYS, 86(2), 1999, pp. 1156-1166
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
86
Issue
2
Year of publication
1999
Pages
1156 - 1166
Database
ISI
SICI code
0021-8979(19990715)86:2<1156:AOTPWP>2.0.ZU;2-I
Abstract
The pressure wave propagation method, usually used to study electrical beha vior of dielectric materials, is applied here to nondestructive detection a nd quantification of adhesion defects in a bilayer structure. This method r elies on a very simple idea: as an electric field is created in a bilayer d ielectric sample placed between short-circuited electrodes, the propagation of a pressure pulse induces an electric signal. If the field distribution is known, the signal leads to the pressure profile all along its propagatio n through the sample and therefore gives information on the interface. Firs t, we extend the signal expression already established for a monolayer stru cture to a multilayer structure and consider particularly bilayer structure s. After explaining the signal analysis in perfectly bonded and totally dis bonded structures, a model is proposed to describe and analyze the signal i n a partially disbonded structure and relate it to the percentage of totall y disbonded area in the zone being tested by the pressure pulse. To assess this analysis, measurements were carried out on kapton (130 mu m)-adhesive (98 mu m) transparent samples. Some samples are perfectly bonded, some are totally disbonded and the others are partially disbonded. The pressure puls e is created by the impact of a laser pulse on an absorbing target coupled to the sample. The excellent agreement between the measurements carried out on perfectly bonded and totally disbonded samples and simulations assesses the correctness of the signal expression for a multilayer structure. In th e case of partially disbonded structures, the value of the percentage of to tally disbonded area, determined by measurement and simulation, is very clo se to that deduced from a photograph of the sample, only possible for trans parent materials. The spatial resolution of the method is related to the sp ectrum of the pressure pulse, which extends up to 200 MHz. This method pres ents an excellent spatial resolution. If the transit time of the pressure p ulse in each medium is superior to 11 ns, measurements and simulations show that owing to this method, it is possible to detect and localize in the st ructure submicron gaps and a percentage of totally disbonded area as low as 5% in the tested zone by analyzing the signals in the time domain in a ver y simple manner.(C) 1999 American Institute of Physics. [S0021-8979(99)0221 4-8].