H. Ascolani et al., Direct atomic structure determination by scanned-energy photoelectron diffraction: Sb/GaAs(110), J ELEC SPEC, 103, 1999, pp. 321-326
Citations number
17
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Fourier transformation of experimental energy-dependent photoelectron diffr
action (PED) data has been used to image independently the local structure
of the two inequivalent adsorption sites of Sb at the GaAs(110)-p(1x1)Sb in
terface. This approach is analogous to several recently developed direct me
thods, even though it does not take into account the atomic scattering phas
e shifts. Our results show that even this simple direct inversion is able t
o provide the real-space images corresponding to the two inequivalent Sb ad
atoms. The approximate structure obtained could be used as a starting point
for a traditional 'trial and error' analysis, which refines and provides a
n accurate surface structure. (C) 1999 Elsevier Science B.V. All rights res
erved.